Science Resources

This post reviews the Scopus and SciFinder cited reference results for:

Short-channel effect improved by lateral channel-engineering in deep-submicronmeter MOSFET's. IEEE Transactions on Electron Devices 44 (4), pp. 627-634 (1997).

SciFinder found 39 cited references with 7 unique and Scopus found 77 cited references with 45 unique. Examining the 7 unique found by SciFinder, 2 items have article records in Scopus, but neither have citation lists, and consequently no citing links. One item appears in the proceeding of IEEE Hong Kong Electron Device Meeting (7th 2000) and the other is in IEEE Transactions on Electron Devices. Scopus labels the latter, which was published in 2009, as "in press." In addition, there are 3 unique items with article records in Scopus, the above article appears in all of the citation lists, but there are not citing links due to citation errors. The 3 articles are in IEEE Transactions on Electron Devices. Finally, there are 2 items not covered by Scopus. The first is in International Semiconductor Device Research Symposium (5th 1999) and the other is a U.S. Patent. As mentioned in earlier posts, patents are not covered in the results list of standard Scopus searches, but appear under the Scopus patents tab. The patent found by SciFinder is in the cited reference list under the Scopus patents tab.

Considering the 45 unique cited reference found by Scopus, 3 have article records in SciFinder, but they have no citation lists, and no citing links. All three are in Chinese-language journals, but their citation lists contain mostly English-language publications. The journals are Wuli Xuebao/Acta Physica Sinica, Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics, and Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. Three additional unique items have article records in SciFinder, all have the above IEEE Transactions on Electron Devices article in their citation lists, but there are no citation links because of citation errors. These articles are in Microelectronics Reliability, IEEE Transactions on Electron Devices, and Journal de Physique IV. Lastly, there are 39 unique Scopus cited references that are not covered by SciFinder. Eight are from journals not covered by SciFinder, 14 are from journals selectively covered by SciFinder, and 17 are conference proceedings not covered by SciFinder. The journals not covered by SciFinder are VLSI Design, Proceedings of World Academy of Science, Engineering and Technology (3 articles), Microwave and Optical Technology Letters, Fluctuation and Noise Letters, IEEE Transactions on Semiconductor Manufacturing, and Chinese Journal of Electronics. It should be noted that Proceedings of World Academy of Science, Engineering and Technology is open access. A list of core journals covered by SciFinder is available at http://www.cas.org/expertise/cascontent/caplus/corejournals.html.